Date: 03/2006
PI News:
P732 Piezo-Z Stage / Z-Nanopositioner for Scanning Microscopy; Precision Vertical Stage
P-732.ZC Z-Nanopositioning Stage Provides High Dynamics
- High Stiffness for High-Dynamics Operation
- Resonant Frequency 1500 Hz
- Settling Time < 2 msec
- Up to 15 µm Vertical Travel Range
- <1 nm Resolution
- Straightness of travel <10 µrad
- Clear Aperture with 25 mm Diameter
The P-732.ZC is a fast, high-resolution vertical positioning stage with direct metrology. Providing subnanometer resolution, less than 2 milliseconds settling time and a straightness of motion of better than 10 µrad, the stage is ideally suited for scanning microscopy applications. In combination with the P-733, 100x100 µm XY stage it becomes a compact XYZ positioning and scanning stage with excellent dynamic performance in the vertical direction.
Show Details
Other Piezo-Z Nanopositioning Stages:
P-541.T0L Low-Profile Piezo-Z Tip/Tilt Stage, open Loop,100µm
P-541.TCD, Low-Profile Piezo-Z, Tip/Tilt Stage Cap.Sensor,100µm
P-541.TSL, Low-Profile Piezo-Z Tip/Tilt Stage with SGS,100µm
P-541.Z0L, Low-Profile
Piezo-Z Nanopositioning Stage, 100µm, Open-Loop, Lemo Connector
P-541.ZCD, Low-Profile Piezo-Z Nanopositioning Stage, 100µm, Cap. Sensors, Sub-D Connector
P-541.ZCL, Low-Profile Piezo-Z Nanopositioning Stage, 100µm, Cap. Sensors, Lemo Connectors
P-541.ZSL, Low-Profile
Piezo-Z Nanopositioning Stage, 100µm, Strain Gauge Sensors, Lemo
Connector
P-558.TCD, Piezo-Z, Tip/Tilt
Nanopositioning Stage, 50µm, 1mrad, Parallel Direct Metrology, for Digital Controller
P-558.ZCD, Piezo-Z
Nanopositioner/Scanning Stage, 50µm, Capacitive Direct Metrology, for Digital Controller
P-518.TCD, Piezo-Z Tip/Tilt Nanopositioning/Scanning Stage, 100µm, 2mrad, Parallel Direct Metrology, for Digital Controller
P-518.ZCD, Piezo-Z Nanopositioning/Scanning Stage, 100µm, Capacitive Direct Metrology
P-528.TCD, Piezo-Z, Tip/Tilt Nanopositioner/Scanning Stage, 200µm, 2mrad, Parallel Direct Metrology, Digital
P-528.ZCD, Piezo-Z Nanopositioner/Scanning Stage, 200µm, Capacitive Direct Metrology
P-622.ZCD, PIHera™ Piezo-Z Nanopositioner/Scanning Stage, 250µm, Capacitive Direct Metrology, Sub-D
P-733.3DD, High-Speed XY, Z-Piezo Nanopositioner/Scanning Stage, 30x30x10µm, Parallel Direct Metrology, 2.2 kHz F-res
P-563.3CD, PIMars™ XY, Z-Piezo Nanopositioner/Scanning Stage, 300x300x300µm, Parallel Direct Metrology, Sub-D
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