P-721 PIFOC® Piezo Flexure Objective Scanner
Fast Nanopositioner and Scanner for Microscope Objectives
P-721.CLQ piezo objective nanopositioning system with P-721.12Q QuickLock option and objective (adapter and objective not included)
P-721.CLQ piezo objective nanopositioning system with P-721.12Q QuickLock option and objective (adapter and objective not included)
  • Scans and Positions Objectives with Sub-nm Resolution
  • Travel Ranges to 140 µm, Millisecond Settling Time
  • Significantly Faster Response and Higher Lifetime than Motorized Z-Stages
  • Parallel Precision Flexure Guiding for Better Focus Stability
  • Choice of Position Sensors: Capacitive Direct Metrology (Higher Performance) or Strain Gauge (Lower Cost)
  • Compatible with Metamorph™ Imaging Software
  • Outstanding Lifetime Due to PICMA® Piezo Actuators
  • QuickLock Adapter for Easy Attachment
  • Clear Aperture up to 29 mm Ř
P-721.xxQ, .SL2 dimensions in mm (adapter to be ordered separately)
 
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Application Examples
  • 3D-Imaging
  • Z Stack Acquisition
  • Screening
  • Interferometry
  • Metrology
  • Disc-drive-testing
  • Autofocus systems
  • Confocal microscopy
  • Biotechnology
  • Semiconductor testing

P-721 PIFOCs® are high-speed, piezo-driven microscope objective nanofocusing/scanning devices, providing a positioning and scanning range of 100 µm with sub-nanometer resolution and very high motion of linearity up to 0.03%. For applications, such as the two-photon spectroscopy wich requires a particulary high resolution, there are versions wich allow a free aperture of up to 29 mm in diameter.
PIFOCs® are also available with up to 460 µm travel (P-725 see link), and for exceptional dynamic and step performance (models P-726 see link and P-725.SDD see link).

Superior Accuracy With Direct-Metrology Capacitive Sensors
Capacitive position feedback is used in the top-of-the-line models. PIs proprietary capacitive sensors measure position directly and without physical contact. They are free of friction and hysteresis, a fact which, in combination with the positioning resolution of well under 1 nm, makes it possible to achieve very high levels of linearity. A further advantage of direct metrology with capacitive sensors is the high phase fidelity and the high bandwidth of up to 10 kHz.
Alternatively, strain gauge sensor (SGS) models are available. The sensors are connected in a bridge configuration to eliminate thermal drift, and assure optimal position stability in the nanometer range.

Open-loop models are available for applications where fast response and very high resolution are essential. Here, specifying or reporting absolute position values is either not required or is handled by external sensors, such as interferometers, a vision system or photodiode PSD (position sensitive detector). These models retain the inherent piezo advantages such as high resolution and speed.

Simple Installation with QuickLock Thread Options
The PIFOC® is mounted between the turret and the objective with the QuickLock thread adapter. After threading the adapter into the turret, the QuickLock is affixed in the desired position. Because the PIFOC® body need not to be rotated, cable wind-up is not an issue.

High Reliability and Long Lifetime
The compact PIFOC® systems are equipped with preloaded PICMA® high-performance piezo actuators which are integra-ted into a sophisticated, FEA-modeled, flexure guiding system. The PICMA® actuators feature cofired ceramic encapsulation and thus offer better performance and reliability than conventional piezo actuators. Actuators, guidance and sensors are maintenance-free and not subject to wear, and thus offer an extraordinary reliability.

Choice of Controllers
A large choice of analog and digital piezo controllers as OEM, bench-top and 19-inch-rackmount versions is available.


Application Articles, Background Information, External Links

Papers & Articles
 
Related Information:
 
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