Nanotechnology for Any Microscope
Or how can I find my atom again?

The answer to this question is best answered by realizing that the P-500 Nanopositioning stages from PI offer the broadest spectrum of piezo scanning and positioning units in the “NANOWORLD” (Fig. 27).


The P-517.3C XYZ nanopositioning stage

 Two different designs rendering 11 different positioning range variations cover nearly all possibilities to suit microscopy and metrology applications. Scanning or positioning along the Z and tip/tilt axes are catered for, in addition to the typical X and Y axes with a resolution in the sub-nanometric region. Scanning up to 200 µm and 2 mrad per axis are supported. For the P-500 family, PI is dedicated towards an internal design mechanism in which all actuators and measuring instruments act on the same platform. This PI commitment ensures an active prevention of a cross-talk between axes. Adopting and applying these methods can achieve a true trajectory better than 1 nm; and this in several dimensions (Fig. 28).

The high resonant frequency is a prerequisite for fast settling times in incremental positioning and for good scanning stage dynamical behavior. The integrated capacitive sensors resolve to better than 0.1 nm and are capable of a scanning linearity to 0.02%: ideal attributes for near-field and confocal microscopy. The compact chassis design, with a height of only 30 mm (XYZ stage!) and an aperture of 66 mm, means that it can be adopted for use with practically any microscope irrespective of whether measuring a reflecting or transmitting source.

The P-500 range are excellently poised for the step into the atomic domain: scanning probe microscopy (SPM). This tube actuator scanning stage dominated field has been revitalized by PI’s piezo stages. Tube actuator scanner side effects, e.g., cross-talk, position drift and angle error, that occur while scanning are eliminated by resorting to the PI-500 family.
A design specially developed for the German institute of standards (PTB) features monitoring on all 6 degrees of freedom and any axis cross-talk is reduced to an order of magnitude in the sub-nanometer or sub-µrad region.
 


Fig. 28: XY scan flatness using a P-500 stage.