Nanopositioning for Microscopy

Fast – Compact – To the Nanometer

Precision positioning is the key element in all types of microscopy. High-resolution microscopy must be capable of accurate and reproducible positioning of imaging elements and samples. Requirements range from Z focus positioning of the objective to coarse and fine positioning of the sample in X, Y, and Z direction as well as often in θX and θY direction and sometimes even in θZ. PI meets these requirements with a broad product portfolio for inverse microscope systems of all major manufacturers.

Coarse and Fine Positioning Sample Stages

  • U-780 PILine® XY Stage System with Controller and Joystick
    • High-resolution piezo linear drive
    • Self-locking at rest | Low noise
    • Highest stability due to low thermal load and no lubricants
    • Large dynamics range of 10 µm/s to 120 mm/s
    • Travel range to 135 mm x 85 mm
    • Compatible with a wide range of sample holders
  • Large selection of fine positioning stages for positioning of samples (sample holders) in the nanometer range
    • Positioning with (sub)nanometer precision in one (Z) direction or in many DOFs; depending on the model and requirements
    • Wide variety of travel ranges and speed

PIFOC® Objective Scanners: Focusing and Z-Stack Scanning with Nanometer Precision

  • With a wide range of PIFOC® lens scanners, PI provides the ability to do just the experiment / sample analysis you want to perform.
  • Latest developments comprise the newly designed PIFOC® P-725.1CDE2 with improved settling times.

Further Applications

Applications for the Sample Positioning Stages

Further Applications for the PIFOC® Scanner

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U-780 PILine® XY Stage System with Controller and Joystick

Stage for use in live-cell imaging, routine microscopy, automated scanning microscopy and as basis stage for super-resolution microscopy.
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PIFOC® Objective & PInano® Sample Scanners for Microscopy

Piezo flexure stages and objective scanners of the PIFOC® and PInano® series offer high dynamics in positioning and scanning tasks. Well adapted solutions for XY specimen positioning parallel and vertical to the optical axis and Z focusing of the objective are available as standard products.
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Precision Positioning of Samples and Objectives

Whether classical stereo microscopy, fluorescent, widefield or laser scanning microscopy, whether SEM, FIB-SEM, TEM, AFM or correlative microscopy - positioning samples and objectives with subnanometer precision is decisive for the quality of your results with all of these techniques. This fully clickable, new “Nanopositioning for Microscopy” brochure provides a comprehensive overview of objective...
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Nanopositioning for Microscopy

Fast, Compact, to the Nanometer
Version / Date
Version / Date
BRO28CN 2018-12
Document language
pdf - 8 MB
pdf - 15 MB

PI Ultra-High Resolution Microscopy

Ultra-High-Resolution Microscopy in a Modular System
Version / Date
WP pi1114
Version / Date
WP pi1114
Document language
pdf - 971 KB
pdf - 969 KB

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