Nanopositioning for Microscopy

Fast – Compact – To the Nanometer

Precision positioning is the key element in all types of microscopy. High-resolution microscopy must be capable of accurate and reproducible positioning of imaging elements and samples. Requirements range from Z focus positioning of the objective to coarse and fine positioning of the sample in X, Y, and Z direction as well as often in θX and θY direction and sometimes even in θZ. PI meets these requirements with a broad product portfolio for inverse microscope systems of all major manufacturers.

Coarse and Fine Positioning Sample Stages

  • U-780 PILine® XY Stage System with Controller and Joystick
    • High-resolution piezo linear drive
    • Self-locking at rest | Low noise
    • Highest stability due to low thermal load and no lubricants
    • Large dynamics range of 10 µm/s to 120 mm/s
    • Travel range to 135 mm x 85 mm
    • Compatible with a wide range of sample holders
  • Large selection of fine positioning stages for positioning of samples (sample holders) in the nanometer range
    • Positioning with (sub)nanometer precision in one (Z) direction or in many DOFs; depending on the model and requirements
    • Wide variety of travel ranges and speed

PIFOC® Objective Scanners: Focusing and Z-Stack Scanning with Nanometer Precision

  • With a wide range of PIFOC® lens scanners, PI provides the ability to do just the experiment / sample analysis you want to perform.
  • Latest developments comprise the newly designed PIFOC® P-725.1CDE2 with improved settling times.

Further Applications

Applications for the Sample Positioning Stages

Further Applications for the PIFOC® Scanner


Recommended Pages

Microscopy

Imaging processes increase efficiency across a number of fields, ranging from medical engineering to pharmaceutical research and manufacturing of semiconductors.
Learn more

U-780 PILine® XY Stage System with Controller and Joystick


Learn more

PIFOC® Objective & PInano® Sample Scanners for Microscopy

Piezo flexure stages and objective scanners of the PIFOC® and PInano® series offer high dynamics in positioning and scanning tasks. Well adapted solutions for XY specimen positioning parallel and vertical to the optical axis and Z focusing of the objective are available as standard products.
Learn more

Precision Positioning of Samples and Objectives

Whether classical stereo microscopy, fluorescent, widefield or laser scanning microscopy, whether SEM, FIB-SEM, TEM, AFM or correlative microscopy - positioning samples and objectives with subnanometer precision is decisive for the quality of your results with all of these techniques. This fully clickable, new “Nanopositioning for Microscopy” brochure provides a comprehensive overview of objective...
Learn more

Setting up and Adjusting a Fluorescent Microscope for Reliable Examination Results

Fluorescent microscopy does not only help to make nanometer-small structures visible, but also to examine living cells and therefore explore the cell processes. In addition to preparing the sample, it is of paramount importance to set up and adjust the microscope properly to get usable results. This is exactly what the GATTAscope project is all about.
Learn more

Downloads

Brochure

Nanopositioning for Microscopy

Fast, Compact, to the Nanometer
Version / Date
BRO28E R5D
Version / Date
BRO28CN 2018-12
Document language
pdf - 8 MB
pdf - 13 MB
Whitepaper

PI Ultra-High Resolution Microscopy

Ultra-High-Resolution Microscopy in a Modular System
Version / Date
WP pi1114
Version / Date
WP pi1114
Document language
pdf - 971 KB
pdf - 969 KB

Related Products

Ask an engineer!

Quickly receive an answer to your question by email or phone from a local PI sales engineer.