Tag: PiezoWalk

Precision Positioning of Samples and Objectives

The Key to Successful Microscoping

Whether classical stereo microscopy, fluorescent, widefield or laser scanning microscopy, whether SEM, FIB-SEM, TEM, AFM or correlative microscopy - positioning samples and objectives with subnanometer precision is decisive for the quality of your results with all of these techniques. This fully clickable, new “Nanopositioning for Microscopy” brochure provides a comprehensive overview of objective...


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Precision Motion and Positioning due to High-Resolution Measuring Technology

External Interferometer vs. Internal Sensor

Read more on „Controlling PI Positioners with External Zygo Interferometer“ in the new whitepaper!


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