P-725.xDD PIFOC® High-Dynamics Piezo Scanner

Nanopositioning and Scanning System for Microscope Objectives

PI P-725.CDD
Fastest settling time under 5 ms with microscope objective
Travel range 18 µm
Scans and positions objectives with sub-nm resolution
Parallel flexure guiding for minimized objective offset
Direct metrology with capacitive sensors for highest linearity
Cost-efficient version with SGS sensors
Compatible with Metamorph™ imaging software
Outstanding lifetime due to PICMA® piezo actuators
QuickLock Thread Adapters for easy attachment

Specifications

This content is only available on tablets or desktop devices.

Drawings / Images

PI P-725.xDD Drawing

Downloads

Datasheet

pdf
pdf

PI Datasheet P-725.xDD

PIFOC® High-Dynamics Piezo Scanner Nanopositioning and Scanning System for Microscope Objectives
pdf - 759 KB
pdf - 752 KB

3D Models

zip

P-725.xDD STEP

English
zip - 574 KB