PD72Z1x PIFOC® Objective Scanning System 100 µm

High-Dynamics Piezo Drive for Sub-Nanometer Resolution

PI P-721 P-709
Complete system with digital controller, software and thread insert
Travel range 100 µm
Scans and positions objectives with sub-nm resolution
Frictionless, high-precision flexure guiding system
Direct metrology with capacitive sensors

PIFOC® objective scanning system with controller and software

Clear aperture to Ø 29 mm. QuickLock adapter for easy attachment

 

Position measurement

With lower-cost strain gauge sensors (SGS) or with highly accurate capacitive sensors for highest linearity and stability. All control parameters can be set and optimized by software

 

Interfaces

USB, RS-232 and analog

 

User software and functions

PIMikroMove, PI General Command Set (GCS). Drivers for LabVIEW, shared libraries for Windows and Linux. Compatible with µManager, MetaMorph, MATLAB

 

Fields of application

Microscopy, confocal microscopy, 3D imaging, screening, autofocus systems, surface analysis, wafer inspection

Specifications

pdf
pdf

Datasheet PD72Z1x

2016-08-23
2016-08-23
pdf - 2 MB
pdf - 2 MB

Drawings / Images

PI PD72Z1 Drawing, PD72Z1xAA with M32-QuickLock adapter with large aperture, dimensions in mm
PI PD72Z1x Drawing, PD72Z1xAQ with M25-QuickLock adapter, dimensions in mm
PI PD72Z1x Diagram, 10 ms settling time with 150 g objective (PD72Z1CAQ system, measured with laser interferometer)

Downloads

Datasheet

pdf
pdf

Datasheet PD72Z1x

2016-08-23
2016-08-23
pdf - 2 MB
pdf - 2 MB

Documentation

pdf

User Manual P721T0007

P-721 Fast PIFOC® Piezo Nanofocusing Z Drive
2017-03-29
English
pdf - 1 MB
pdf

Technical Note P721T0002

P-721, P-725 PIFOC® QuickLock Thread Option
2017-03-29
English
pdf - 2 MB