Tag: Piezoelectric Inertia Drives

Precision Positioning of Samples and Objectives

The Key to Successful Microscoping

Whether classical stereo microscopy, fluorescent, widefield or laser scanning microscopy, whether SEM, FIB-SEM, TEM, AFM or correlative microscopy - positioning samples and objectives with subnanometer precision is decisive for the quality of your results with all of these techniques. This fully clickable, new “Nanopositioning for Microscopy” brochure provides a comprehensive overview of objective scanners and sample stages with up to six degrees of motion freedom – illustrated by a variety of today’s microscopy techniques.

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Setting up and Adjusting a Fluorescent Microscope for Reliable Examination Results

PI Supports the GATTAscope Project

Fluorescent microscopy does not only help to make nanometer-small structures visible, but also to examine living cells and therefore explore the cell processes. In addition to preparing the sample, it is of paramount importance to set up and adjust the microscope properly to get usable results. This is exactly what the GATTAscope project is all about.

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