- Many configuration options for application-optimized dynamics
- Active control of device temperature
- Extensive safety and monitoring functionalities
- Linearity error maximum of 0.01 %
Cost-optimized, high-performance controller
For piezo-based single-axis nanopositioning systems with capacitive sensors. Output voltage -30 to 130 V. Amplifier and sensor evaluation optimized for dynamic applications. Digital linearization. Digital servo controller can optionally be combined with profile generator and position feedforward control. Wave generator. Data recorder. Autozero. Trigger I/O. Supports all current ID chips from PI. Compact design with functional blocks for an easy derivation of OEM versions.
High position stability of the sensor electronics thanks to active temperature control. Adaptable to a wide variety of operating conditions. Temperature stable in less than 10 minutes after switching on. A short warm-up phase allows continuous operation to be dispensed with, therefore increasing the lifetime of the nanopositioning system while reducing energy requirement.
Safety and monitoring functionalities
Overtemperature protection for amplifier and sensor electronics. Short-circuit proof. Continuous, hardware-based measurement of input and output values such as voltage and current as well as internal temperature. High-frequency measurements for static and dynamic evaluation. Remote diagnostics possible thanks to specific query and recording of values.
USB and RS-232/RS-485 for commanding via PI General Command Set (GCS). Real-time SPI interface for position specification and query. High-bandwidth analog control input or sensor input. Analog output for sensor monitor or controlling an external amplifier. The servo cycle can be synchronized via differential inputs and outputs and the SPI interface.
Extensive software support, e.g., for NI LabVIEW, C, C++, MATLAB, Python. Compatible with µManager and MetaMorph. PIMikroMove user software.
- Multiphoton microscopy, confocal microscopy
- 3-D imaging
- Autofocus systems
- Surface analysis
- Wafer inspection
User Manual E709T0002
SPI Interface Description
User Manual PZ305
E-709.1C1L Digital piezo controller, 1 axis, -30 to 130 V, capacitive sensor, monitoring functionality, benchtop device
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